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High Temperature Testing with Sapphire Fiber White-Light Michelson InterferometersIn the design of new aerospace materials, developmental testing is conducted to characterize the behavior of the material under severe environmental conditions of high stress, temperature, and vibration. But to test these materials under extreme conditions requires sensors that can perform in harsh environments. Current sensors can only monitor high temperature test samples using long throw instrumentation, but this is inherently less accurate than a surface mounted sensor, and provides no means for fabrication process monitoring. A promising alternative is the use of sapphire optical fiber sensors. Sapphire is an incredibly rugged material, being extremely hard (9 mhos), chemically inert, and having a melting temperature (over 2000 C). Additionally, there is a extensive background of optical fiber sensors upon which to draw for sapphire sensor configurations.
Document ID
19960047680
Document Type
Conference Paper
Authors
Barnes, A. (Virginia Polytechnic Inst. and State Univ. Blacksburg, VA United States)
Pedrazzani, J. (Virginia Polytechnic Inst. and State Univ. Blacksburg, VA United States)
May, R. (Virginia Polytechnic Inst. and State Univ. Blacksburg, VA United States)
Murphy, K. (Virginia Polytechnic Inst. and State Univ. Blacksburg, VA United States)
Tran, T. (Fiber and Sensor Technologies, Inc. Blacksburg, VA United States)
Coate, J. (Wright Lab. Wright-Patterson AFB, OH United States)
Date Acquired
August 17, 2013
Publication Date
March 1, 1996
Publication Information
Publication: Proceedings of the 4th Annual Workshop: Advances in Smart Materials for Aerospace Applications
Subject Category
Optics
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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IDRelationTitle19960047656Analytic PrimaryProceedings of the 4th Annual Workshop: Advances in Smart Materials for Aerospace Applications
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