NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
the wavelength-dispersive spectrometer and its proposed use in the analytical electron microscopeThe Analytical Electron Microscope (AEM) equipped with a wavelength-dispersive spectrometer (WDS) should have the ability to resolve peaks which normally overlap in the spectra from an energy-dispersive spectrometer (EDS). With a WDS it should also be possible to measure lower concentrations of elements in thin foils due to the increased peak-to-background ratio compared with EDS. The WDS will measure X-ray from the light elements (4 less than Z less than 1O) more effectively. This paper addresses the possibility of interfacing a compact WDS with a focussing circle of approximately 4 cm to a modem AEM with a high-brightness (field emission) source of electrons.
Document ID
19970014618
Document Type
Reprint (Version printed in journal)
Authors
Goldstein, Joseph I.
(Lehigh Univ. Bethlehem, PA United States)
Lyman, Charles E.
(Lehigh Univ. Bethlehem, PA United States)
Williams, David B.
(Lehigh Univ. Bethlehem, PA United States)
Date Acquired
August 17, 2013
Publication Date
January 1, 1989
Publication Information
Publication: Ultramicroscopy
Volume: 28
ISSN: 0304-3991
Subject Category
Instrumentation and Photography
Report/Patent Number
NASA-CR-204008
NAS 1.26:204008
Funding Number(s)
CONTRACT_GRANT: NAG9-45
CONTRACT_GRANT: DE-FG02-86ER-45269
Distribution Limits
Public
Copyright
Public Use Permitted.
Document Inquiry