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The Imaging Properties of a Silicon Wafer X-Ray TelescopeSilicon wafers have excellent optical properties --- low microroughness and good medium-scale flatness --- which Make them suitable candidates for inexpensive flat-plate grazing-incidence x-ray mirrors. On short spatial scales (less than 3 mm) the surface quality of silicon wafers rivals that expected of the Advanced X-Ray Astrophysics Facility (AXAF) high-resolution optics. On larger spatial scales, however, performance may be degraded by the departure from flatness of the wafer and by distortions induced by the mounting scheme. In order to investigate such effects, we designed and constructed a prototype silicon-wafer x-ray telescope. The device was then tested in both visible light and x rays. The telescope module consists of 94 150-mm-diameter wafers, densely packed into the first stage of a Kirkpatrick-Baez configuration. X-ray tests at three energies (4.5, 6.4, and 8.0 keV) showed an energy-independent line spread function with full width at half maximum (FWHM) of 150 arcseconds, dominated by deviations from large-scale flatness.
Document ID
19970016800
Document Type
Reprint (Version printed in journal)
Authors
Joy, M. K.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Kolodziejczak, J. J.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Weisskopf, M. C.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Fair, S.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Ramsey, B. D.
(NASA Marshall Space Flight Center Huntsville, AL United States)
Date Acquired
August 17, 2013
Publication Date
July 26, 1994
Publication Information
Publication: SPIE Proceedings Series
Publisher: International Society for Optical Engineering
Volume: 2279
ISBN: 0-8194-1603-7
Subject Category
Astronomy
Report/Patent Number
NASA-TM-112328
NAS 1.15:112328
Meeting Information
Meeting: Advances in Multilayer and Grazing Incidence X-Ray/EUV/FUV Optics
Location: San Diego, CA
Country: United States
Start Date: July 24, 1994
End Date: July 26, 1994
Accession Number
97N71522
Distribution Limits
Public
Copyright
Public Use Permitted.
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