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sequential test strategies for multiple fault isolationIn this paper, we consider the problem of constructing near optimal test sequencing algorithms for diagnosing multiple faults in redundant (fault-tolerant) systems. The computational complexity of solving the optimal multiple-fault isolation problem is super-exponential, that is, it is much more difficult than the single-fault isolation problem, which, by itself, is NP-hard. By employing concepts from information theory and Lagrangian relaxation, we present several static and dynamic (on-line or interactive) test sequencing algorithms for the multiple fault isolation problem that provide a trade-off between the degree of suboptimality and computational complexity. Furthermore, we present novel diagnostic strategies that generate a static diagnostic directed graph (digraph), instead of a static diagnostic tree, for multiple fault diagnosis. Using this approach, the storage complexity of the overall diagnostic strategy reduces substantially. Computational results based on real-world systems indicate that the size of a static multiple fault strategy is strictly related to the structure of the system, and that the use of an on-line multiple fault strategy can diagnose faults in systems with as many as 10,000 failure sources.
Document ID
19980096375
Document Type
Other
Authors
Shakeri, M.
(Connecticut Univ. Storrs, CT United States)
Pattipati, Krishna R.
(Connecticut Univ. Storrs, CT United States)
Raghavan, V.
(Connecticut Univ. Storrs, CT United States)
Patterson-Hine, Ann
(NASA Ames Research Center Moffett Field, CA United States)
Kell, T.
(Sikorsky Aircraft Bridgeport, CT United States)
Date Acquired
August 18, 2013
Publication Date
May 1, 1997
Publication Information
Publication: Multiple Fault Isolation in Redundant Systems
Subject Category
Quality Assurance and Reliability
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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