NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Ground Laboratory Soft X-Ray Durability Evaluation of Aluminized Teflon FEP Thermal Control InsulationMetallized Teflon fluorinated ethylene propylene (FEP) thermal control insulation is mechanically degraded if exposed to a sufficient fluence of soft x-ray radiation. Soft x-ray photons (4-8 A in wavelength or 1.55 - 3.2 keV) emitted during solar flares have been proposed as a cause of mechanical properties degradation of aluminized Teflon FEP thermal control insulation on the Hubble Space Telescope (HST). Such degradation can be characterized by a reduction in elongation-to-failure of the Teflon FEP. Ground laboratory soft x-ray exposure tests of aluminized Teflon FEP were conducted to assess the degree of elongation degradation which would occur as a result of exposure to soft x-rays in the range of 3-10 keV. Tests results indicate that soft x-ray exposure in the 3-10 keV range, at mission fluence levels, does not alone cause the observed reduction in elongation of flight retrieved samples. The soft x-ray exposure facility design, mechanical properties degradation results and implications will be presented.
Document ID
19980210772
Document Type
Reprint (Version printed in journal)
Authors
Banks, Bruce A. (NASA Lewis Research Center Cleveland, OH United States)
deGroh, Kim K. (NASA Lewis Research Center Cleveland, OH United States)
Stueber, Thomas J. (NYMA, Inc. Brook Park, OH United States)
Sechkar, Edward A. (NYMA, Inc. Brook Park, OH United States)
Hall, Rachelle L. (Ohio Aerospace Inst. Cleveland, OH United States)
Date Acquired
September 6, 2013
Publication Date
July 1, 1998
Subject Category
Nonmetallic Materials
Report/Patent Number
NASA/TM-1998-207914/REV1
NAS 1.15:207914/REV1
E-11186/REV1
Funding Number(s)
PROJECT: RTOP 632-1A-1E
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Available Downloads

NameType 19980210772.pdf STI