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Precision Spectroscopy, Diode Lasers, and Optical Frequency Measurement TechnologyThis compilation is a selected set of reprints from the Optical Frequency Measurement Group of the Time and Frequency Division of the National Institute of Standards and Technology, and consists of work published between 1987 and 1997. The two main programs represented here are (1) development of tunable diode-laser technology for scientific applications and precision measurements, and (2) research toward the goal of realizing optical-frequency measurements and synthesis. The papers are organized chronologically in five, somewhat arbitrarily chosen categories: Diode Laser Technology, Tunable Laser Systems, Laser Spectroscopy, Optical Synthesis and Extended Wavelength Coverage, and Multi-Photon Interactions and Optical Coherences.
Document ID
19980227882
Acquisition Source
Headquarters
Document Type
Other
Authors
Hollberg, Leo
(National Inst. of Standards and Technology Boulder, CO United States)
Fox, Richard
(National Inst. of Standards and Technology Boulder, CO United States)
Waltman, Steve
(National Inst. of Standards and Technology Boulder, CO United States)
Robinson, Hugh
(National Inst. of Standards and Technology Boulder, CO United States)
Date Acquired
September 6, 2013
Publication Date
May 1, 1998
Subject Category
Optics
Report/Patent Number
PB98-148992
NIST/TN-1504
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Keywords
DIODE LASERS
BIBLIOGRAPHIES
FREQUENCY MEASUREMENT
OPTICAL PROPERTIES
LASER SPECTROSCOPY
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