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Low Power Polysilicon Sources for IR ApplicationsWe have designed and fabricated polysilicon thin film infrared (IR) sources by micromachining technology. These sources are made with a lightly doped middle region for light emission and heavy doping of the supporting legs. The sources are fabricated on a 10 mm thick, low temperature process parameters in the fabrication of these silicon dioxide layer. Different doping levels were used to achieve various source resistances. From the power requirement to reach the required light emission versus source resistance curve it is seen that there exists a resistance value which minimizes the necessary input power.
Document ID
19980237456
Acquisition Source
Goddard Space Flight Center
Document Type
Reprint (Version printed in journal)
Authors
Das, N. C.
(Raytheon STX Corp. Lanham, MD United States)
Jhabvala, M.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Shu, P.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
September 6, 2013
Publication Date
August 1, 1998
Subject Category
Nonmetallic Materials
Meeting Information
Meeting: ICSICT Conference on Solid State and Integrated Circuit Technology
Location: Beijing
Country: China
Start Date: October 21, 1998
End Date: October 23, 1998
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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