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Electronic Structure of Tl2Ba2CuO(6+Delta) Epitaxial Films Measured by X-Ray PhotoemissionThe valence electronic structure and core levels of Tl2Ba2CuO(6 + delta) (Tl-2201) epitaxial films have been measured with X-ray photoelectron spectroscopy and are compared to those of Tl2Ba2CaCu2O(8 + delta) (Tl-2212). Changes in the Tl-2201 core-level binding energies with oxygen doping are consistent with a change in the chemical potential. Differences between the Tl-2201 and Tl-2212 measured densities of states are consistent with the calculated Cu 3d and Tl 6s partial densities of states.
Document ID
19990008054
Acquisition Source
Headquarters
Document Type
Reprint (Version printed in journal)
Authors
Vasquez, R. P.
(Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Ren, Z. F.
(State Univ. of New York Buffalo, NY United States)
Wang, J. H.
(State Univ. of New York Buffalo, NY United States)
Date Acquired
August 19, 2013
Publication Date
September 1, 1996
Publication Information
Publication: Physical Review B (Condensed Matter)
Publisher: American Physical Society
Volume: 54
Issue: 9
ISSN: 0163-1829
Subject Category
Solid-State Physics
Distribution Limits
Public
Copyright
Other

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