An Experimental Study of a Radially Arranged Thin Film Heat Flux Gauge

A new thin-film heat-flux gauge was designed and fabricated on three different substrate materials. Forty pairs of Pt-Pt/10% Rh thermocouple junctions were deposited in a circular pattern on the same plane of the substrate. Over the thermocouples, 5 and 10 micron thick thermal resistance layers were deposited to create a temperature gradient across those layers. Calibration and testing of these gauges were carried out in an arc-lamp calibration facility. The heat flux calculated from the gauge output is in good agreement with the value obtained from the pre-calibrated standard sensor. A CO2 laser was also used to test the steady-state and dynamic responses of the heat-flux gauge. During the steady-state test, the time constant for the heating period was 30 s. The frequency response of the heat-flux gauge was measured in the frequency domain using a CO2 laser and a chopper. The responses from an infrared detector and the heat-flux gauge were measured simultaneously and compared. It was found that the thin-film heat-flux gauge has a dynamic frequency response of 3 kHz.