Document Type
Conference Proceedings
Authors
Stecher, Joseph L., III (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
September 6, 2013
Publication Date
February 1, 1999
Report/Patent Number
NASA/CP-1999-208598NAS 1.55:208598Rept-98A01761 Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
Available Downloads
19990040464.pdf STIcloud_downloadcontent_copyvisibilityRelated Records
19990040483Analytic SubsidiaryOn-Orbit Teflon(trademark) FEP Degradation19990040481Analytic SubsidiaryAtomic Oxygen Effects on Seal Leakage19990040485Analytic SubsidiaryDegradation of Teflon(trademark) FEP Following Charged Particle Radiation and Rapid Thermal Cycling19990040477Analytic SubsidiaryCable Bundle Wire Derating19990040491Analytic SubsidiaryRefurbishment and Automation of Thermal Vacuum Facilities at NASA/GSFC19990040469Analytic SubsidiaryStatistical Evaluation of Molecular Contamination During Spacecraft Thermal Vacuum Test19990040486Analytic SubsidiaryEffect of X-Rays on the Mechanical Properties of Aluminized FEP Teflon(trademark)19990040482Analytic SubsidiaryRadiation Induced Degradation of White Thermal Control Paint19990040465Analytic SubsidiaryInnovative Contamination Certification of Multi-Mission Flight Hardware