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Record Details

Record 65 of 19191
Broadband Infrared Antireflection Structured Silicon Surfaces
Author and Affiliation:
Stewart, Kenneth(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Fettig, Rainer(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Allen, Christine(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Fettig, Rainer(Raytheon Co., Information Technology and Scientific Services, Greenbelt, MD United States)
Larocque, Jennifer(Saint Michael's Coll., Colchester, VT United States)
Abstract: Silicon and germanium are materials often used for IR windows and optical elements. However they have a very high index of refraction, in the order of three to four, which causes large reflection losses on each surface. These losses are especially high under large angles of incidence which are often desirable if signals are faint and fast optics are to be used. Solid antireflection coatings are either not available because materials with appropriate index of refraction do not exist, or their use is limited to a small wavelength range and small angles of incidence. We will present the status of our work to calculate, create, and test the performance of graded structures in Si to reduce its surface reflection. The structures are expected to work over the very broad wavelength range of 10 microns to 1000 microns and a wide range of angle of incidence. We have identified several high aspect ratio MEMS process techniques to create the structures and have done 3D electromagnetic modeling, which predicts significant effects. Measurements on different samples have validated our modeling.
Publication Date: Jan 01, 1998
Document ID:
19990067833
(Acquired Sep 17, 1999)
Subject Category: OPTICS
Document Type: Reprint
Meeting Information: 20-26 Mar. 1999; Atlanta, GA; United States
Meeting Sponsor: American Physical Society; United States
Financial Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD United States
Organization Source: NASA Goddard Space Flight Center; Greenbelt, MD United States
Description: 1p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
NASA Terms: ANTIREFLECTION COATINGS; BROADBAND; REFRACTIVITY; SILICON; GERMANIUM; LENS DESIGN; MICROELECTROMECHANICAL SYSTEMS; MODELS; ELECTROMAGNETIC PROPERTIES
Availability Source: Other Sources
Availability Notes: Abstract Only;
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