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Correction Factor for Gaussian Deconvolution of Optically Thick Linewidths in Homogeneous SourcesProfiles of optically thick, non-Gaussian emission line profiles convoluted with Gaussian instrumental profiles are constructed, and are deconvoluted on the usual Gaussian basis to examine the departure from accuracy thereby caused in "measured" linewidths. It is found that "measured" linewidths underestimate the true linewidths of optically thick lines, by a factor which depends on the resolution factor r congruent to Doppler width/instrumental width and on the optical thickness tau(sub 0). An approximating expression is obtained for this factor, applicable in the range of at least 0 <= tau(sub 0) <= 10, which can provide estimates of the true linewidth and optical thickness.
Document ID
19990088169
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Kastner, S. O.
(Kastner (S. O.) Greenbelt, MD United States)
Bhatia, A. K.
(NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
August 19, 2013
Publication Date
January 1, 1999
Subject Category
Physics (General)
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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