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Current Radiation Issues for Programmable Elements and DevicesThe purpose of this presentation is to discuss the COTS performance, clock upset / single event transient, device configuration upset, antifuse hardening, heavy ion SEU, total dose, proton sensitivities, latchup, and additional information and data.
Document ID
20000023195
Acquisition Source
Goddard Space Flight Center
Document Type
Reprint (Version printed in journal)
Authors
Katz, Richard (NASA Goddard Space Flight Center Greenbelt, MD United States)
LaBel, K. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Reed, R. (NASA Goddard Space Flight Center Greenbelt, MD United States)
Wang, J. J. (Actel Corp. Sunnyvale, CA United States)
Cronquist, B. (Actel Corp. Sunnyvale, CA United States)
McCollum, J. (Actel Corp. Sunnyvale, CA United States)
Paolini, W. (Actel Corp. Sunnyvale, CA United States)
Sin, B. (Actel Corp. Sunnyvale, CA United States)
Koga, R.a (Aerospace Corp. Los Angeles, CA United States)
Crain, S. (Aerospace Corp. Los Angeles, CA United States)
Brown, R. (Lockheed Martin Federal Systems Manassas, VA United States)
Scott, T. (Lockheed Martin Federal Systems Manassas, VA United States)
Date Acquired
August 19, 2013
Publication Date
January 1, 1998
Subject Category
Computer Programming And Software
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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