Characterization of Thin Film Microstrip Lines on Polyimide

This paper presents an in depth characterization of thin film microstrip (TFMS) lines fabricated on Dupont PI-2611 polyimide. Measured attenuation and effective dielectric constant is presented for TFMS lines with thicknesses from 2.45-7.4 microns and line widths from 5-34.4 microns over the frequency range of 1-110 GHz. The attenuation is separated into conductor and dielectric losses to determine the loss tangent of Dupont PI-2611 polyimide over the microwave frequency range. In addition, the measured characteristics are compared to closed form equations for a and eff from the literature. Based on the comparisons, recommendations for the best dosed form design equations for TFMS are made.