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Metrology and Alignment of Light Weight Grazing Incidence X-Ray MirrorsMetrology and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc-minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It will allow us to align thin X-ray mirrors to-an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.
Document ID
20000083951
Document Type
Preprint (Draft being sent to journal)
Authors
Zhang, William (NASA Goddard Space Flight Center Greenbelt, MD United States)
Content, David (NASA Goddard Space Flight Center Greenbelt, MD United States)
Petre, Robert (NASA Goddard Space Flight Center Greenbelt, MD United States)
Saha, Timo (NASA Goddard Space Flight Center Greenbelt, MD United States)
Date Acquired
August 19, 2013
Publication Date
January 1, 2000
Subject Category
Optics
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.