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Record Details

Record 1 of 825
Metrology and Alignment of Light Weight Grazing Incidence X-Ray Mirrors
Author and Affiliation:
Zhang, William(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Content, David(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Petre, Robert(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Saha, Timo(NASA Goddard Space Flight Center, Greenbelt, MD United States)
Abstract: Metrology and alignment of light weight X-ray optics have been a challenge for two reasons: (1) that the intrinsic mirror quality and distortions caused by handling can not be easily separated, and (2) the diffraction limits of the visible light become a severe problem at the order of one arc-minute. Traditional methods of using a normal incident pencil or small parallel beam which monitors a tiny fraction of the mirror in question at a given time can not adequately monitor those distortions. We are developing a normal incidence setup that monitors a large fraction, if not the whole, of the mirror at any given time. It will allow us to align thin X-ray mirrors to-an accuracy of a few arc seconds or to a limit dominated by the mirror intrinsic quality.
Publication Date: Jan 01, 2000
Document ID:
20000083951
(Acquired Sep 15, 2000)
Subject Category: OPTICS
Document Type: Preprint
Meeting Information: 30 Jul. - 4 Aug. 2000
Meeting Sponsor: International Society for Optical Engineering; United States
Financial Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD United States
Organization Source: NASA Goddard Space Flight Center; Greenbelt, MD United States
Description: 1p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
NASA Terms: METROLOGY; ALIGNMENT; GRAZING INCIDENCE; MIRRORS; X RAY OPTICS; PENCIL BEAMS; VISIBLE SPECTRUM; LIGHT (VISIBLE RADIATION)
Availability Source: Other Sources
Availability Notes: Abstract Only
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