NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Atomic Force Microscope for Imaging and SpectroscopyWe have developed, built, and tested an atomic force microscope (AFM) for extraterrestrial applications incorporating a micromachined tip array to allow for probe replacement. It is part of a microscopy station originally intended for NASA's 2001 Mars lander to identify the size, distribution, and shape of Martian dust and soil particles. As well as imaging topographically down to nanometer resolution, this instrument can be used to reveal chemical information and perform infrared and Raman spectroscopy at unprecedented resolution.
Document ID
20010020497
Document Type
Conference Paper
Authors
Pike, W. T. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Hecht, M. H. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Anderson, M. S. (Jet Propulsion Lab., California Inst. of Tech. Pasadena, CA United States)
Akiyama, T. (Neuchatel Univ. Switzerland)
Gautsch, S. (Neuchatel Univ. Switzerland)
deRooij, N. F. (Neuchatel Univ. Switzerland)
Staufer, U. (Neuchatel Univ. Switzerland)
Niedermann, Ph. (Swiss Center for Electronics and Microtechnology, Inc. Neuchatel, Switzerland)
Howald, L. (Nanosurf AG Liestal Switzerland)
Mueller, D. (Nanosurf AG Liestal Switzerland)
Date Acquired
August 20, 2013
Publication Date
July 1, 2000
Publication Information
Publication: Concepts and Approaches for Mars Exploration
Issue: Part 2
Subject Category
Inorganic, Organic and Physical Chemistry
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

Related Records

IDRelationTitle20010020461Analytic PrimaryConcepts and Approaches for Mars Exploration
Document Inquiry