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Image Registration: A Necessary EvilRegistration of test and reference images is a key component of nearly all PSP data reduction techniques. This is done to ensure that a test image pixel viewing a particular point on the model is ratioed by the reference image pixel which views the same point. Typically registration is needed to account for model motion due to differing airloads when the wind-off and wind-on images are taken. Registration is also necessary when two cameras are used for simultaneous acquisition of data from a dual-frequency paint. This presentation will discuss the advantages and disadvantages of several different image registration techniques. In order to do so, it is necessary to propose both an accuracy requirement for image registration and a means for measuring the accuracy of a particular technique. High contrast regions in the unregistered images are most sensitive to registration errors, and it is proposed that these regions be used to establish the error limits for registration. Once this is done, the actual registration error can be determined by locating corresponding points on the test and reference images, and determining how well a particular registration technique matches them. An example of this procedure is shown for three transforms used to register images of a semispan model. Thirty control points were located on the model. A subset of the points were used to determine the coefficients of each registration transform, and the error with which each transform aligned the remaining points was determined. The results indicate the general superiority of a third-order polynomial over other candidate transforms, as well as showing how registration accuracy varies with number of control points. Finally, it is proposed that image registration may eventually be done away with completely. As more accurate image resection techniques and more detailed model surface grids become available, it will be possible to map raw image data onto the model surface accurately. Intensity ratio data can then be obtained by a "model surface ratio," rather than an image ratio. The problems and advantages of this technique will be discussed.
Document ID
20020034950
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Bell, James
(NASA Ames Research Center Moffett Field, CA United States)
McLachlan, Blair
(NASA Ames Research Center Moffett Field, CA United States)
Hermstad, Dexter
(NASA Ames Research Center Moffett Field, CA United States)
Trosin, Jeff
(NASA Ames Research Center Moffett Field, CA United States)
George, Michael W.
Date Acquired
August 20, 2013
Publication Date
January 1, 1995
Subject Category
Documentation And Information Science
Meeting Information
Meeting: Workshop on Pressure, Temperature and Shear Sensitive Coatings
Location: Gainesville, FL
Country: United States
Start Date: May 8, 1995
End Date: May 10, 1995
Funding Number(s)
PROJECT: RTOP 505-59-53
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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