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Langmuir Probe Measurements of Inductively Coupled Plasma in CF4/AR/O2 MixturesInductively coupled plasmas of CF4:Ar:O2, which have been of importance to material processing, were studied in the GEC cell at 80:10:10, 60:20:20, and 40:30:30 mixture ratios. Radial distributions of plasma potential (V(sub p)), electron and ion number densities (n(sub e) and n(sub i)), electron temperature (T(sub e)), and electron energy distribution functions (EEDFs) were measured in the mid-plane of plasma across the electrodes in the pressure range of 10-50 mTorr, and RF power of 200 and 300 W. V(sub p), n(sub e) and n(sub i), which peak in the center of the plasma, increase with decrease of pressure. T(sub e) also increases with pressure but peaks toward the electrode edge. Both V(sub p) and T(sub e) remain nearly independent of RF power, whereas n(sub e) and n(sub i) increase with power. In all conditions the EEDFs exhibit non-Maxwellian shape and are more like Druyvesteyn form at higher energies. They exhibit a broad lip in the energy range 0-10 eV suggesting an electron loss mechanism, which could be due to via resonance electron attachment processes producing negative ions in this rich electronegative gas mixture. This behavior is more prominent towards the electrode edge.
Document ID
20020042704
Acquisition Source
Ames Research Center
Document Type
Conference Paper
Authors
Rao, M. V. V. S.
(Eloret Corp. Moffett Field, CA United States)
Cruden, Brett
(Eloret Corp. Moffett Field, CA United States)
Sharma, Surendra
(NASA Ames Research Center Moffett Field, CA United States)
Meyyappan, Meyya
(NASA Ames Research Center Moffett Field, CA United States)
Date Acquired
August 20, 2013
Publication Date
October 9, 2001
Subject Category
Plasma Physics
Meeting Information
Meeting: GEC01 Meeting of The American Physical Society
Location: State College, PA
Country: United States
Start Date: October 9, 2001
End Date: October 12, 2001
Funding Number(s)
PROJECT: RTOP 632-62-01
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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