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In-Flight Observations of Long-Term Single Event Effect(SEE)Performance on Orbview-2 and Xray Timing Explorer(XTE)Solid State Recorders (SSR)This paper presents Single Event Effect (SEE) in-flight data on Solid State Recorders (SSR) that have been collected over a long period of time for two NASA spacecraft: Orbview-2 and XTE. SEE flight data on solid-state memories give an opportunity to study the behavior in space of SEE sensitive commercial devices. The actual Single Event Upset (SEU) rates can be compared with the calculated rates based on environment models and ground test data. The SEE mitigation schemes can also be evaluated in actual implementation. A significant amount of data has already been published concerning observed SEE effects on memories in space. However, most of the data presented cover either a short period of time or a small number of devices. The data presented here has been collected on a large number of devices during several years. This allows statistically significant information about the effect of space weather fluctuations on SEU rates, and the effectiveness of SEE countermeasures used to be analyzed. Only Orbview-2 data is presented in this summary. XTE data will be included in the final paper.
Document ID
20030025777
Document Type
Preprint (Draft being sent to journal)
Authors
Poivey, Christian (SGT, Inc. Greenbelt , MD, United States)
Barth, Janet L. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
LaBel, Ken A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Gee, George (SGT, Inc. Greenbelt , MD, United States)
Safren, Harvey (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 21, 2013
Publication Date
January 1, 2003
Subject Category
Spacecraft Design, Testing and Performance
Meeting Information
IEEE Nuclear and Space Radiation Effect Conference(Monterey, CA)
Distribution Limits
Public
Copyright
Public Use Permitted.
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