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High Accuracy Thermal Expansion Measurement At Cryogenic TemperaturesA new, interferometer based system for measuring thermal expansion to an absolute accuracy of 20 ppb or better at cryogenic temperatures has been developed. Data from NIST Copper SRM 736 measured from room temperature to 15 K will be presented along with data from many other materials including beryllium, ULE, Zerodur, and composite materials. Particular attention will be given to a study by the Space Optics Manufacturing Technology Center (SOMTC) investigating the variability of ULE and beryllium materials used in the AMSD program. Approximately 20 samples of each material, tested from room temperature to below 30 K are compared as a function of billet location.
Document ID
20030068136
Acquisition Source
Marshall Space Flight Center
Document Type
Conference Paper
Authors
Stallcup, Michael
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Presson, Joan
(NASA Marshall Space Flight Center Huntsville, AL, United States)
Tucker, James
(Southern Research Inst. Research Triangle Park, NC, United States)
Daspit, Gregory
(Southern Research Inst. Research Triangle Park, NC, United States)
Nein, Max
(Alabama Univ. Huntsville, AL, United States)
Date Acquired
August 21, 2013
Publication Date
January 1, 2003
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: SPIE Optical Science and Technology Conference
Location: San Diego, CA
Country: United States
Start Date: August 3, 2003
End Date: August 8, 2003
Sponsors: International Society for Optical Engineering
Funding Number(s)
CONTRACT_GRANT: NASA Order H-35206D
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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