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Record Details

Record 1 of 14895
Acquisition of a High Resolution Field Emission Scanning Electron Microscope for the Analysis of Returned Samples
Author and Affiliation:
Nittler, Larry R.(Carnegie Institution of Washington, Sample Return Lab. Instrument and Data Analysis Program, Washington, DC, United States)
Abstract: This grant furnished funds to purchase a state-of-the-art scanning electron microscope (SEM) to support our analytical facilities for extraterrestrial samples. After evaluating several instruments, we purchased a JEOL 6500F thermal field emission SEM with the following analytical accessories: EDAX energy-dispersive x-ray analysis system with fully automated control of instrument and sample stage; EDAX LEXS wavelength-dispersive x-ray spectrometer for high sensitivity light-element analysis; EDAX/TSL electron backscatter diffraction (EBSD) system with software for phase identification and crystal orientation mapping; Robinson backscatter electron detector; and an in situ micro-manipulator (Kleindiek). The total price was $550,000 (with $150,000 of the purchase supported by Carnegie institution matching funds). The microscope was delivered in October 2002, and most of the analytical accessories were installed by January 2003. With the exception of the wavelength spectrometer (which has been undergoing design changes) everything is working well and the SEM is in routine use in our laboratory.
Publication Date: Jan 01, 2003
Document ID:
20030068424
(Acquired Sep 30, 2003)
Subject Category: INSTRUMENTATION AND PHOTOGRAPHY
Coverage: Final Report
Document Type: Technical Report
Contract/Grant/Task Num: NAG5-11900
Financial Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD, United States
Organization Source: Carnegie Institution of Washington; Dept. of Terrestrial Magnetism; Washington, DC, United States
Description: 1p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
NASA Terms: SCANNING ELECTRON MICROSCOPY; EXTRATERRESTRIAL MATTER; X RAY SPECTROMETERS; SENSITIVITY ANALYSIS; AUTOMATIC CONTROL; X RAY SOURCES; X RAY ANALYSIS
Availability Source: Other Sources
Availability Notes: Abstract Only
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