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X-ray Polarimetry with an Active-Matrix Pixel Proportional CounterWe report the first results from an X-ray polarimeter with a micropattern gas proportional counter using an amorphous silicon active matrix readout. With 100% polarized X-rays at 4.5 keV, we obtain a modulation factor of 0.33+/- 0.03, confirming previous reports of the high polarization sensitivity of a finely segmented pixel proportional counter. The detector described here has a geometry suitable for the focal plane of an astronomical X-ray telescope. Amorphous silicon readout technology will enable additional extensions and improvements.
Document ID
20030096004
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Black, J. K.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Deines-Jones, P.
(Universities Space Research Association Greenbelt, MD, United States)
Ready, S. E.
(Palo Alto Research Center Palo Alto, CA)
Street, R. A.
(Palo Alto Research Center Palo Alto, CA)
Date Acquired
August 21, 2013
Publication Date
January 1, 2003
Subject Category
Optics
Funding Number(s)
CONTRACT_GRANT: NRA-01-01-HEA-021
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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