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Extraction of Qualitative Features from Sensor Data Using Windowed Fourier TransformIn this paper, we use Matlab to model the health monitoring of a system through the information gathered from sensors. This implies assessment of the condition of the system components. Once a normal mode of operation is established any deviation from the normal behavior indicates a change. This change may be due to a malfunction of an element, a qualitative change, or a change due to a problem with another element in the network. For example, if one sensor indicates that the temperature in the tank has experienced a step change then a pressure sensor associated with the process in the tank should also experience a step change. The step up and step down as well as sensor disturbances are assumed to be exponential. An RC network is used to model the main process, which is step-up (charging), drift, and step-down (discharging). The sensor disturbances and spike are added while the system is in drift. The system is allowed to run for a period equal to three time constant of the main process before changes occur. Then each point of the signal is selected with a trailing data collected previously. Two trailing lengths of data are selected, one equal to two time constants of the main process and the other equal to two time constants of the sensor disturbance. Next, the DC is removed from each set of data and then the data are passed through a window followed by calculation of spectra for each set. In order to extract features the signal power, peak, and spectrum are plotted vs time. The results indicate distinct shapes corresponding to each process. The study is also carried out for a number of Gaussian distributed noisy cases.
Document ID
20040001403
Acquisition Source
Stennis Space Center
Document Type
Conference Paper
Authors
Amini, Abolfazl M.
(Southern Univ. Baton Rouge, LA, United States)
Figueroa, Fenando
(NASA Stennis Space Center Stennis Space Center, MS, United States)
Date Acquired
August 21, 2013
Publication Date
September 26, 2003
Subject Category
Quality Assurance And Reliability
Report/Patent Number
SE-2003-08-00063-SSC
Meeting Information
Meeting: SPIE Defense and Security Symposium
Location: Orlando, FL
Country: United States
Start Date: April 12, 2003
End Date: April 16, 2003
Sponsors: International Society for Optical Engineering
Funding Number(s)
CONTRACT_GRANT: NAG13-98003
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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