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In-Flight Edge Response Measurements for High Spatial Resolution Remote Sensing SystemsIn-flight measurement of spatial resolution were conducted as part of the ASA Scientific Data Purchase (SDP) Validation and Verification (V&V) process. Characterization included remote sensing systems with ground sample distance (GSD) of 1 meter or less, such as the panchromatic imager on-board the ICONOS satellite and the airborne ADAR System 5500 multispectral instrument. Final image products were used to evaluate the effect of both the image acquisition system (e.g., optics, electronics, motion, jitter, atmosphere) and image post-processing (e.g., resampling, modulation trasfer function (MTF) compensator). Spatial resolution was characterized by full width at half maximum (FWHM) of an edge response-derived line spread function. This was found to be a more robust measure of spatial resolution than the value of NTF at Nyquist frequency The edge responses were analysed using the tilted-edge technique that ovecomes the spatial sampling limitations of the digital imaging systems. As an enhancement to existing algorithms, the slope of the edge response and the orientation of the edge target were determined by a single computational process. Adjacent black and white square panels, either painted on a flat surface or deployed as traps, formed the ground-based edge targets used in the tests. Orientation of the deployable tarps was optimized beforehand, based on simulations of the imaging system. Numerous edge target images were analyzed for each of the tested sensors. The effect of such factors as acquisition geometry, temporal variability, MTF compensation, and GSD on spatial resolution were investigated.
Document ID
20040001411
Acquisition Source
Stennis Space Center
Document Type
Conference Paper
Authors
Blonski, Slawomir
(Lockheed Martin Space Operations Bay Saint Louis, MS, United States)
Pagnutti, Mary
(Lockheed Martin Space Operations Bay Saint Louis, MS, United States)
Ryan, Robert
(Lockheed Martin Space Operations Bay Saint Louis, MS, United States)
Zanoni, Vicki
(NASA Stennis Space Center Stennis Space Center, MS, United States)
Date Acquired
August 21, 2013
Publication Date
December 3, 2001
Subject Category
Instrumentation And Photography
Report/Patent Number
SE-2001-11-00066-SSC
Meeting Information
Meeting: International Society of Optical Engineering (SPIE) Conference
Location: Seattle, WA
Country: United States
Start Date: July 7, 2002
End Date: July 11, 2002
Funding Number(s)
CONTRACT_GRANT: NAS13-650
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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