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Record Details

Record 16 of 306
Measurement Sets and Sites Commonly Used for Characterization
Author and Affiliation:
Pagnutti, Mary(Lockheed Martin Space Operations, Commercial Remote Sensing Directorate, Bay Saint Louis, MS, United States)
Holekamp, Kara(Lockheed Martin Space Operations, Commercial Remote Sensing Directorate, Bay Saint Louis, MS, United States)
Ryan, Robert(Lockheed Martin Space Operations, Commercial Remote Sensing Directorate, Bay Saint Louis, MS, United States)
Sellers, Richard(Lockheed Martin Space Operations, Commercial Remote Sensing Directorate, Bay Saint Louis, MS, United States)
Davis, Bruce(NASA Stennis Space Center, Stennis Space Center, MS, United States)
Zanoni, Vicki(NASA Stennis Space Center, Stennis Space Center, MS, United States)
Abstract: Scientists at NASA's Earth Science Applications Directorate are creating a well-characterized Verification & Validation (V&V) site at the Stennis Space Center. This site enables the in-flight characterization of remote sensing systems and the data they acquire. The data are predominantly acquired by commercial, high spatial resolution satellite systems, such as IKONOS and QuickBird 2, and airborne systems. The smaller scale of these newer high resolution remote sensing systems allows scientists to characterize the geometric, spatial, and radiometric data properties using a single V&V site. The targets and techniques used to characterize data from these newer systems can differ significantly from the techniques used to characterize data from the earlier, coarser spatial resolution systems. Scientists are also using the SSC V&V site to characterize thermal infrared systems and active LIDAR systems. SSC employs geodetic targets, edge targets, radiometric tarps, and thermal calibration ponds to characterize remote sensing data products. This paper presents a proposed set of required measurements for visible through long-wave infrared remote sensing systems and a description of the Stennis characterization. Other topics discussed include: 1) The use of ancillary atmospheric and solar measurements taken at SSC that support various characterizations; 2) Additional sites used for radiometric, geometric, and spatial characterization in the continental United States; 3) The need for a standardized technique to be adopted by CEOS and other organizations.
Publication Date: Mar 11, 2002
Document ID:
20040005904
(Acquired Jan 21, 2004)
Subject Category: EARTH RESOURCES AND REMOTE SENSING
Report/Patent Number: NASA/SE-2002-03-00019-SSC
Document Type: Preprint
Meeting Information: ISPRS Commission I Mid-Term Symposium; 10-15 Nov. 2002; Denver, CO; United States
Meeting Sponsor: International Society for Photogrammetry and Remote Sensing; Unknown
Contract/Grant/Task Num: NAS13-650
Financial Sponsor: NASA Stennis Space Center; Stennis Space Center, MS, United States
Organization Source: NASA Stennis Space Center; Stennis Space Center, MS, United States
Lockheed Martin Space Operations; Commercial Remote Sensing Directorate; Bay Saint Louis, MS, United States
Description: 2p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
NASA Terms: REMOTE SENSING; CHARACTERIZATION; REMOTE SENSORS; IN-FLIGHT MONITORING; SATELLITE IMAGERY; HIGH RESOLUTION; INFRARED INSTRUMENTS; ATMOSPHERIC OPTICS; RADIOMETERS; STANDARDS; OPTICAL RADAR; THERMAL MAPPING
Availability Source: Other Sources
Availability Notes: Abstract Only
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