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Comparison of Single-Event Transients Induced in an Operational Amplifier (LM124) by Pulsed Laser Light and a Broad Beam of Heavy IonsA comparison of transients from heavy-ion and pulsed-laser testing shows good agreement for many different voltage configurations. The agreement is illustrated by comparing directly individual transients and plots of transient amplitude versus width.
Document ID
20040034773
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Buchner, Steve
(QSS Group, Inc. MD, United States)
McMorrow, Dale
(Naval Research Lab. Washington, DC, United States)
Poivey, Christian
(SGT, Inc. Greenbelt , MD, United States)
Howard, James, Jr.
(Jackson and Tull, Inc. Greenbelt, MD, United States)
Pease, Rom
(RLP Research, Inc. Albuquerque, NM, United States)
Savage, Mark
(Naval Sea Systems Command Crane, IN, United States)
Boulghassoul, Younis
(Vanderbilt Univ. Nashville, TN, United States)
Massengill, Lloyd
(Vanderbilt Univ. Nashville, TN, United States)
Date Acquired
August 21, 2013
Publication Date
January 1, 2003
Subject Category
Lasers And Masers
Meeting Information
Meeting: European Conference on Radiation and its Effects on Components and Systems
Location: Noordwijk
Country: Netherlands
Start Date: September 15, 2003
End Date: September 19, 2003
Distribution Limits
Public
Copyright
Public Use Permitted.
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