Synchrotron X-Ray Diffraction Analysis of Meteorites in Thin Section: Preliminary ResultsX-ray diffraction is the pre-eminent technique for mineral identification and structure determination, but is difficult to apply to grains in thin section, the standard meteorite preparation. Bright focused X-ray beams from synchrotrons have been used extensively in mineralogy and have been applied to extraterrestrial particles. The intensity and small spot size achievable in synchrotron X-ray beams makes them useful for study of materials in thin sections. Here, we describe Synchrotron X-ray Diffraction (SXRD) in thin section as done at the National Synchrotron Light Source, and cite examples of its value for studies of meteorites in thin section.
Document ID
20040059921
Acquisition Source
Johnson Space Center
Document Type
Conference Paper
Authors
Treiman, A. H. (Lunar and Planetary Inst. Houston, TX, United States)
Lanzirotti, A. (Chicago Univ. Chicago, IL, United States)
Xirouchakis, D. (GEOTERRA Geotechnical Consultants Athens, Greece)
Date Acquired
August 21, 2013
Publication Date
January 1, 2004
Publication Information
Publication: Lunar and Planetary Science XXXV: Martian Meteorites: Chemical Weathering