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Novel Sample-handling Approach for XRD Analysis with Minimal Sample PreparationSample preparation and sample handling are among the most critical operations associated with X-ray diffraction (XRD) analysis. These operations require attention in a laboratory environment, but they become a major constraint in the deployment of XRD instruments for robotic planetary exploration. We are developing a novel sample handling system that dramatically relaxes the constraints on sample preparation by allowing characterization of coarse-grained material that would normally be impossible to analyze with conventional powder-XRD techniques.
Document ID
20040062509
Document Type
Conference Paper
Authors
Sarrazin, P. (Apparati, Inc. Mountain View, CA, United States)
Chipera, S. (Los Alamos National Lab. NM, United States)
Bish, D. (Indiana Univ. Bloomington, IN, United States)
Blake, D. (NASA Ames Research Center Moffett Field, CA, United States)
Feldman, S. (NASA Ames Research Center Moffett Field, CA, United States)
Vaniman, D. (Los Alamos National Lab. NM, United States)
Bryson, C. (Apparati, Inc. Mountain View, CA, United States)
Date Acquired
August 21, 2013
Publication Date
January 1, 2004
Publication Information
Publication: Lunar and Planetary Science XXXV: Missions and Instruments: Hopes and Hope Fulfilled
Subject Category
Lunar and Planetary Science and Exploration
Distribution Limits
Public
Copyright
Public Use Permitted.

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IDRelationTitle20040062499Analytic PrimaryLunar and Planetary Science XXXV: Missions and Instruments: Hopes and Hope Fulfilled
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