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The Cryogenic, High-Accuracy, Refraction Measuring System (CHARMS): A New Facility for Cryogenic Infrared through Vacuum Far-Ultraviolet Refractive Index MeasurementsThe optical designs of future NASA infrared (IR) missions and instruments, such as the James Webb Space Telescope's (JWST) Near-Mixed Camera (NIRCam), will rely on accurate knowledge of the index of refraction of various IR optical materials at cryogenic temperatures. To meet this need, we have developed a Cryogenic, High-Accuracy Refraction Measuring System (CHARMS). In this paper we discuss the completion of the design and construction of CHARMS as well as the engineering details that constrained the final design and hardware implementation. In addition, we will present our first light, cryogenic, IR index of refraction data for LiF, BaF2, and CaF2, and compare our results to previously published data for these materials.
Document ID
20040090623
Acquisition Source
Goddard Space Flight Center
Document Type
Conference Paper
Authors
Frey, Bradley J.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Leviton, Douglas B.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 21, 2013
Publication Date
January 1, 2004
Subject Category
Instrumentation And Photography
Meeting Information
Meeting: SPIE Astronomical Telescope and Instrumentation
Country: United States
Start Date: June 21, 2004
End Date: June 25, 2004
Sponsors: International Society for Optical Engineering
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.

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