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Monte Carlo Techniques for Calculations of Charge Deposition and Displacement Damage from Protons in Visible and Infrared Sensor ArraysThis slide presentation examines motivation for Monte Carlo methods, charge deposition in sensor arrays, displacement damage calculations, and future work. The discussion of charge deposition sensor arrays includes Si active pixel sensor APS arrays and LWIR HgCdTe FPAs. The discussion of displacement damage calculations includes nonionizing energy loss (NIEL), HgCdTe NIEL calculation results including variance, and implications for damage in HgCdTe detector arrays.
Document ID
20040139805
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Marshall, Paul
(Marshall (Paul) United States)
Reed, Robert
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Fodness, Bryan
(SGT, Inc. Greenbelt , MD, United States)
Jordan, Tom
(EMPC United States)
Pickel, Jim
(P and RT United States)
Xapsos, Michael
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Burke, Ed
(Burke (Ed) United States)
Date Acquired
August 22, 2013
Publication Date
January 1, 2004
Subject Category
Statistics And Probability
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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