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In-Flight Observations of Long-Term Single-Event Effect (SEE) Performance on X-ray Timing Explorer (XTE) Solid-state Recorders (SSRs)We present multi-year Single Event Upset (SEU) flight data on Solid State Recorder (SSR) memories for the X-ray Timing Explorer (XTE) NASA mission. Actual SEU rates are compared to the predicted rates based on ground test data and environment models.
Document ID
20040171189
Acquisition Source
Goddard Space Flight Center
Document Type
Preprint (Draft being sent to journal)
Authors
Poivey, Christian (SGT, Inc. Greenbelt , MD, United States)
Gee, George (SGT, Inc. Greenbelt , MD, United States)
LaBel, Kenneth A. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Barth, Janet L. (NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 22, 2013
Publication Date
January 1, 2004
Subject Category
Spacecraft Instrumentation And Astrionics
Meeting Information
Meeting: 2004 IEEE Nuclear and Space Radiation Effects Conference (NSREC04)
Location: Atlanta, GA
Country: United States
Start Date: July 22, 2004
Sponsors: Institute of Electrical and Electronics Engineers
Funding Number(s)
CONTRACT_GRANT: IACRO-03-40351
CONTRACT_GRANT: IACRO-04-40641
Distribution Limits
Public
Copyright
Work of the US Gov. Public Use Permitted.
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