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Absolute Measurement of Tilts via Fourier Analysis of InterferogramsThe Fourier method of interferogram analysis requires the introduction of a constant tilt into the interferogram to serve as a carrier signal for information on the figure of the surface under test. This tilt is usually removed in the first steps of analysis and ignored thereafter. However, in the problem of aligning optical components and systems, knowledge of part orientation is crucial to proper instrument performance. This paper outlines an algorithm which uses the normally ignored carrier signal in Fourier analysis to compute an absolute tilt (orientation) of the test surface. We also provide a brief outline of how this technique, incorporated in a rotating Twyman-Green interferometer, can be used in alignment and metrology of optical systems.
Document ID
Document Type
Preprint (Draft being sent to journal)
Toland, Ronald W.
(NASA Goddard Space Flight Center Greenbelt, MD, United States)
Date Acquired
August 22, 2013
Publication Date
January 1, 2004
Subject Category
Meeting Information
Meeting: SPIE - Optical Science and Technology Annual Meeting
Location: Denver, CO
Country: United States
Start Date: August 2, 2004
End Date: August 6, 2004
Sponsors: International Society for Optical Engineering
Distribution Limits
Work of the US Gov. Public Use Permitted.
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