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Record 23 of 140
Absolute Measurement of Tilts via Fourier Analysis of Interferograms
Offline Availability: Go to Request Form
Author and Affiliation:
Toland, Ronald W.(NASA Goddard Space Flight Center, Greenbelt, MD, United States)
Abstract: The Fourier method of interferogram analysis requires the introduction of a constant tilt into the interferogram to serve as a carrier signal for information on the figure of the surface under test. This tilt is usually removed in the first steps of analysis and ignored thereafter. However, in the problem of aligning optical components and systems, knowledge of part orientation is crucial to proper instrument performance. This paper outlines an algorithm which uses the normally ignored carrier signal in Fourier analysis to compute an absolute tilt (orientation) of the test surface. We also provide a brief outline of how this technique, incorporated in a rotating Twyman-Green interferometer, can be used in alignment and metrology of optical systems.
Publication Date: Jan 01, 2004
Document ID:
(Acquired Nov 30, 2004)
Subject Category: OPTICS
Document Type: Preprint
Meeting Information: SPIE - Optical Science and Technology Annual Meeting; 2-6 Aug. 2004; Denver, CO; United States
Meeting Sponsor: International Society for Optical Engineering; United States
Financial Sponsor: NASA Goddard Space Flight Center; Greenbelt, MD, United States
Organization Source: NASA Goddard Space Flight Center; Greenbelt, MD, United States
Description: 5p; In English
Distribution Limits: Unclassified; Publicly available; Unlimited
Rights: No Copyright
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