Non-contact Creep Resistance Measurement for Ultra-High Temperature Materials

Conventional techniques for measuring creep are limited to about 1700 C, so a new technique is required for higher temperatures. This technique is based on electrostatic levitation (ESL) of a spherical sample, which is rotated quickly enough to cause creep deformation by centrifugal acceleration. Creep of samples has been demonstrated at up to 2300 C in the ESL facility at NASA MSFC, while ESL itself has been applied at over 3000 C, and has no theoretical maximum temperature. The preliminary results and future directions of this NASA-funded research collaboration will be presented.