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A reliability evaluation methodology for memory chips for space applications when sample size is smallThis paper presents a reliability evaluation methodology to obtain the statistical reliability information of memory chips for space applications when the test sample size needs to be kept small because of the high cost of the radiation hardness memories.
Document ID
20060029341
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/7942
Authors
Chen, Y.
Nguyen, D.
Guertin, S.
Berstein, J.
White, M.
Menke, R.
Kayali, S.
Date Acquired
August 23, 2013
Publication Date
October 20, 2003
Distribution Limits
Public
Copyright
Other
Keywords
reliability memory

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