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Single-event upset in advanced PowerPC microprocessorsProton and heavy-ion single-event upset susceptibility has been measured for the MotorolaPowerPC7400. The results show that this advanced device has low upset susceptibility, despite the scaling and design advances.
Document ID
20060029795
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
Authors
Irom, F.
Swift, G. M.
Farmanesh, F.
Millward, D. G.
Date Acquired
August 23, 2013
Publication Date
July 15, 2002
Subject Category
Space Radiation
Distribution Limits
Public
Copyright
Other
Keywords
radiation single-event upset

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