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Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devicesAccelerated life testing of GaAs complementary heterojunction field effect transistors (CHFET) was carried out. Temperature dependence of single and synchronous rectifier CHFET device characteristics were also obtained.
Document ID
20060030311
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/10618
Authors
Gallegos, M.
Leon, R.
Vu, D. T.
Okuno, J.
Johnson, A. S.
Date Acquired
August 23, 2013
Publication Date
October 10, 2002
Distribution Limits
Public
Copyright
Other
Keywords
CHFET GaAs devices III-V devices III-V temperature dependence

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