NTRS - NASA Technical Reports Server
Accelerated life testing and temperature dependence of device characteristics in GaAs CHFET devicesAccelerated life testing of GaAs complementary heterojunction field effect transistors (CHFET) was carried out. Temperature dependence of single and synchronous rectifier CHFET device characteristics were also obtained.
Vu, D. T.
Johnson, A. S.
August 23, 2013
October 10, 2002
CHFET GaAs devices III-V devices III-V temperature dependence