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Reliability and endurance of FRAM: a case studyThis paper describes a case study quantifying reliability and endurance results of two FRAM nonvolatile memories.
Document ID
20060030363
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/10677
Authors
Namkung, J.
Patel, J.
Date Acquired
August 23, 2013
Publication Date
November 4, 2002
Distribution Limits
Public
Copyright
Other
Keywords
FRAM non-volatile memory reliability single-event upsets SEU

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