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Assessing application vulnerability to radiation-induced SEUs in memoryOne of the goals of the Remote Exploration and Experimentation (REE) project at JPL is to determine how vulnerable applications are to single event upsets (SEUs) when run in low radiation space environments using commercial-off-the-shelf (COTS) components.
Document ID
20060031419
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/12628
Authors
Springer, P. L.
Date Acquired
August 23, 2013
Publication Date
April 1, 2001
Subject Category
Computer Programming And Software
Distribution Limits
Public
Copyright
Other
Keywords
radiation SEU software vulnerability

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