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Scaling and technology issues for soft error ratesTh effects of device technology and scaling on soft error rates are discussed, using information obtained from both the device and space communities as a guide to determine the net effect on soft errors.
Document ID
20060033525
Acquisition Source
Jet Propulsion Laboratory
Document Type
Conference Paper
External Source(s)
hdl:2014/16240
Authors
Johnston, A. H.
Date Acquired
August 23, 2013
Publication Date
October 30, 2000
Subject Category
Space Radiation
Distribution Limits
Public
Copyright
Other
Keywords
soft error rate space radiation high-energy proton microelectronics

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