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Radiation Effects in Advanced Microelectonic TechnologiesSeveral new radiation phenomena have been observed in laboratory testing of advanced microelectonics that are not yet of sufficient importance for typical space applications, but provide insight into the likely effects of scaling and device design on radiation hardness.
Document ID
20060035372
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/22353
Authors
Johnston, A. H.
Date Acquired
August 23, 2013
Publication Date
September 15, 1997
Distribution Limits
Public
Copyright
Other
Keywords
Radiation Microelectronic Microdose Gate-Rupture

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