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Device See Susceptibility From Heavy Ions (1995-1996)A seventh set of heavy ion single event effects (SEE) test data have been collected since the last IEEE publications. SEE trends are indicated for several functional classes of ICs.
Document ID
20060035396
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/22392
Authors
Nichols, D. K.
Coss, J. R.
Miyahira, T. F.
Schwartz, H. R.
Swift, G. M.
Koga, R.
Crain, W. R.
Crawford, K. B.
Penzin, S. H.
Date Acquired
August 23, 2013
Publication Date
July 21, 1997
Distribution Limits
Public
Copyright
Other
Keywords
Heavy Ions

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