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The Measurement of the Directional Hemispherical Reflectance From SpectralonThe directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm.
Document ID
20060035600
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
hdl:2014/22681
Authors
Haner, D. A.
McGuckin, B. T.
Menzies, R. T.
Bruegge, C. J.
Duval, V.
Date Acquired
August 23, 2013
Publication Date
September 1, 1997
Distribution Limits
Public
Copyright
Other
Keywords
Spectralon Hemisphere

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