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Accelerated Lifetime Testing and Failure Analysis of Quartz Based GaAs Planar Schottky DiodesAccelerated lifetime tests have been performed on intergrated planar GaAs Schottky diodes that were bonded to quartz substrates up-side-down with a heat-cured epoxy.
Document ID
20060035691
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Lin, R.
Mehdi, I.
Pease, A.
Dengler, R.
Humphrey, D.
Lee, T.
Scherer, A.
Kayali, S.
Date Acquired
August 23, 2013
Publication Date
October 12, 1997
Subject Category
Electronics And Electrical Engineering
Distribution Limits
Public
Copyright
Other
Keywords
Testing

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