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Hardness Assurance Techniques for New Generation COTS DevicesHardness Assurance (HA) techniques and total dose radiation characterization data for new generation linear and COTS devices from various manufacturers are presented. A bipolar op amp showed significant degradation at HDR, not at low dose rate environment. New generation low-power op amps showed more degradation at low voltage applications. HA test techniques for COTS devices are presented in this paper.
Document ID
20060036383
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Lee, C. I.
Rax, B. G.
Johnston, A. H.
Date Acquired
August 23, 2013
Publication Date
July 15, 1996
Distribution Limits
Public
Copyright
Other
Keywords
New Millenium advanced technologies miniature spacecraft