Polarimetric Hyperspectral Imaging Systems and Applications

This paper reports activities in the development of AOTF Polarimetric Hyperspectral Imaging (PHI) Systems at JPL along with field observation results for illustrating the technology capabilities and advantages in remote sensing. In addition, the technology was also used to measure thickness distribution and structural imperfections of silicon-on-silicon wafers using white light interference phenomenon for demonstrating the potential in scientific and industrial applications.