NASA Logo

NTRS

NTRS - NASA Technical Reports Server

Back to Results
Silicon Detector Studies with an Interferometric Thickness MapperCosmic ray isotopic composition studies aboard satellites are normally based on energy detection measurements which require a precise knowledge of matter thickness particle penetration. A laser- interferometer system has been developed to precisely map the thick- ness variations of large-area silicon detectors. Design, operation, and the data processing to derive thickness maps is described.
Document ID
20060037298
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Milliken, B.
Leske, R. A.
Wiedenbeck, M. E.
Date Acquired
August 23, 2013
Publication Date
August 1, 1995
Distribution Limits
Public
Copyright
Other
Keywords
Cosmic Rays Silicon Detectors Interferometry Satellites

Available Downloads

There are no available downloads for this record.
No Preview Available