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Total Ionizing Dose Effects on High Resolution (12-/14-bit) Analog-to-Digital ConvertersThis paper reports total dose radiation test results for high resolution 12-/14-bit A/D converters. Small changes in internal components can cause these devices to fail their specifications at relatively low total dose levels. Degradation of signal-to-noise ratio becomes increasingly importamt for high accuracy converters. Rebound effects in the thick-oxide MOS devices causes these responses to be different at low and high dose rates, which is a major concern for space applications.
Document ID
20060038014
Acquisition Source
Jet Propulsion Laboratory
Document Type
Preprint (Draft being sent to journal)
External Source(s)
Authors
Lee, C. I.
Rax, B. G.
Johnson, A. H.
Date Acquired
August 23, 2013
Publication Date
July 21, 1994
Distribution Limits
Public
Copyright
Other
Keywords
radiation ionizing analog-to-digital converters MOS devices signal-to-noise
ratio space applications

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